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[IEEE 47th ARFTG Conference Digest - San Francisco, CA, USA (1996.06.20-1996.06.21)] 47th ARFTG Conference Digest - Development of On-Wafer Microstrip Characterization Techniques

[IEEE 47th ARFTG Conference Digest - San Francisco, CA, USA (1996.06.20-1996.06.21)] 47th ARFTG Conference Digest - Development of On-Wafer Microstrip Characterization Techniques

Pham, A.; Laskar, J.; Schappacher, J.

作者Pham, A.; Laskar, J.; Schappacher, J.
文件大小413.15KB
发表时间1996
DOI10.1109/arftg.1996.327168
页码85-94

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