[IEEE Comput. Soc. Press 14th VLSI Test Symposium - Princeton, NJ, USA (28 April-1 May 1996)] Proceedings of 14th VLSI Test Symposium - Bridging fault coverage improvement by power supply control
Renovell, M.; Huc, P.; Bertrand, Y.
- 作者Renovell, M.; Huc, P.; Bertrand, Y.
- 文件大小515.39KB
- 发表时间1996
- DOI10.1109/vtest.1996.510877
- 页码338-343