Studies on quantitative x-ray diffraction characterization of phase depth profiles
- 期刊名称Review of Scientific Instruments
- 作者Luo, Jian; Tao, Kun; Yin, Hong; Du, Yong
- 卷第67卷
- 期第8期
- 印刷ISSN0034-6748
- 文件大小353.00KB
- 发表时间1996
- DOI10.1063/1.1147124
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