Computer integrated manufacturing: a complex information system
- 期刊名称Production Planning & Control
- 作者LEVARY, REUVEN R.
- 卷第7卷
- 期第2期
- 印刷ISSN0953-7287
- 电子ISSN1366-5871
- 文件大小3847.44KB
- 发表时间1996-03
- DOI10.1080/09537289608930340
- 页码184-189
Image analysis and simulation software in transmission electron microscopyStadelmann, P · Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada · 2003
Surface Microanalysis with Slow ElectronsBauer, Ernst G. · Microscopy and Microanalysis · 2006
Scientific ProgramMicroscopy and Microanalysis · 2008
Nanogenerators and NanopiezotronicsWang, ZL · Microscopy and Microanalysis · 2009
Trichomonads under MicroscopyBenchimol, Marlene · Microscopy and Microanalysis · 2004
Electron Microscopic Studies with GrapheneMeyer, J; Chuvilin, A; Kaiser, U · Microscopy and Microanalysis · 2009
Stress Whitening Morphology of Multiphase PolypropyleneWestphal, S · Microscopy and Microanalysis · 2006
Aberration-Corrected Lorentz MicroscopyNuhfer, NT; Budruk, A; De Graef, M · Microscopy and Microanalysis · 2010