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Reduction of Selectivity Loss Probability on Dielectric Surface during Chemical Vapor Deposition of Tungsten Using Fluorinated Oxide and Removing Silanol Units on Dielectric Surface

Reduction of Selectivity Loss Probability on Dielectric Surface during Chemical Vapor Deposition of Tungsten Using Fluorinated Oxide and Removing Silanol Units on Dielectric Surface

K. M. Chang; S. W. Wang; C. H. Li; J. Y. Tsai; T. H. Yeh
  • 作者K. M. Chang; S. W. Wang; C. H. Li; J. Y. Tsai; T. H. Yeh
  • 文件大小2645.64KB
  • 发表时间1996
  • DOI10.1143/JJAP.35.6555
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