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Formation Process of Highly Reliable Ultra-Thin Gate Oxide

Formation Process of Highly Reliable Ultra-Thin Gate Oxide

K. Ohmi; T. Iwamoto; T. Yabune; T. Miyake; T. Ohmi
  • 作者K. Ohmi; T. Iwamoto; T. Yabune; T. Miyake; T. Ohmi
  • 文件大小565.56KB
  • 发表时间1996
  • DOI10.1143/JJAP.35.1531
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