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Low defect density amorphous silicon germanium alloy (1.5 eV) deposited at high growth rate under helium dilution in RF-PECVD method

Low defect density amorphous silicon germanium alloy (1.5 eV) deposited at high growth rate under helium dilution in RF-PECVD method

Sukti Hazra; A.R. Middya; Swati Ray
  • 作者Sukti Hazra; A.R. Middya; Swati Ray
  • 卷第211卷
  • 印刷ISSN0022-3093
  • 文件大小549.29KB
  • 发表时间1997
  • DOI10.1016/s0022-3093(96)00631-x
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