[IEEE 1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings - Sinaia, Romania (7-11 Oct. 1997)] 1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings - Complex studies of porous silicon aging phenomena
Torchinskaya, T.V.; Korsunskaya, N.E.; Khomenkova, L.Yu.; Sheinkman, M.K.; Baran, N.P.; Misiuk, A.; Surma, B.
- 作者Torchinskaya, T.V.; Korsunskaya, N.E.; Khomenkova, L.Yu.; Sheinkman, M.K.; Baran, N.P.; Misiuk, A.; Surma, B.
- 卷第1卷
- 文件大小291.91KB
- 发表时间1997
- DOI10.1109/smicnd.1997.651574
- 页码173-176