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[IEEE 1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings - Sinaia, Romania (7-11 Oct. 1997)] 1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings - Complex studies of porous silicon aging phenomena

[IEEE 1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings - Sinaia, Romania (7-11 Oct. 1997)] 1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings - Complex studies of porous silicon aging phenomena

Torchinskaya, T.V.; Korsunskaya, N.E.; Khomenkova, L.Yu.; Sheinkman, M.K.; Baran, N.P.; Misiuk, A.; Surma, B.
  • 作者Torchinskaya, T.V.; Korsunskaya, N.E.; Khomenkova, L.Yu.; Sheinkman, M.K.; Baran, N.P.; Misiuk, A.; Surma, B.
  • 卷第1卷
  • 文件大小291.91KB
  • 发表时间1997
  • DOI10.1109/smicnd.1997.651574
  • 页码173-176
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