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[IEEE Comput. Soc Sixth Asian Test Symposium (ATS'97) - Akita, Japan (17-19 Nov. 1997)] Proceedings Sixth Asian Test Symposium (ATS'97) - On energy efficiency of VLSI testing

[IEEE Comput. Soc Sixth Asian Test Symposium (ATS'97) - Akita, Japan (17-19 Nov. 1997)] Proceedings Sixth Asian Test Symposium (ATS'97) - On energy efficiency of VLSI testing

Cheng-Wen Wu,

作者Cheng-Wen Wu,
文件大小468.68KB
发表时间1997
DOI10.1109/ATS.1997.643948
页码132-137

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