[IEEE Comput. Soc Sixth Asian Test Symposium (ATS'97) - Akita, Japan (17-19 Nov. 1997)] Proceedings Sixth Asian Test Symposium (ATS'97) - On the adders with minimum tests
- 作者Kajihara, S.; Sasao, T.
- 文件大小459.88KB
- 发表时间1997
- DOI10.1109/ATS.1997.643907
- 页码10-15
[IRE 1966 International Electron Devices Meeting - ()] 1966 International Electron Devices Meeting - C<inf>c</inf>Compensated transistorsHaines, G.W. · 1966
[IRE 1966 International Electron Devices Meeting - ()] 1966 International Electron Devices Meeting - Electron beam scanlaserMyers, R.A.; Pole, R.V. · 1966
[IRE 1966 International Electron Devices Meeting - ()] 1966 International Electron Devices Meeting - Multicavity optical couplersPetroff, M.D. · 1966
[IRE 1966 International Electron Devices Meeting - ()] 1966 International Electron Devices Meeting - Micropower devices for integrated circuitsStehlin, R.; Bohannon, R. · 1966
[IRE 1966 International Electron Devices Meeting - ()] 1966 International Electron Devices Meeting - Electronics for ocean engineeringMomsen, C.B. · 1966
[IRE 1966 International Electron Devices Meeting - ()] 1966 International Electron Devices Meeting - Magnetron harmonic generationYu, S.P.; Vartanian, P.A.; Buneman, O. · 1966
[IRE 1966 International Electron Devices Meeting - ()] 1966 International Electron Devices Meeting - Microwave plasma varactorsWada, J.Y.; Knechtli, R.C.; Forman, B.J. · 1966
[IRE 1966 International Electron Devices Meeting - ()] 1966 International Electron Devices Meeting - PNP silicon UHF transistorKurosawa, T.; Yanagawa, T. · 1966