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[IEEE Comput. Soc. Press Great Lakes Symposium on VLSI - Urbana-Champaign, IL, USA (13-15 March 1997)] Proceedings Great Lakes Symposium on VLSI - How an

[IEEE Comput. Soc. Press Great Lakes Symposium on VLSI - Urbana-Champaign, IL, USA (13-15 March 1997)] Proceedings Great Lakes Symposium on VLSI - How an "evolving" fault model improves the behavioral test generation

Buonanno, G.; Ferrandi, F.; Ferrandi, L.; Fummi, F.; Sciuto, D.

作者Buonanno, G.; Ferrandi, F.; Ferrandi, L.; Fummi, F.; Sciuto, D.
文件大小708.04KB
发表时间1997
DOI10.1109/GLSV.1997.580515
页码124-129

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