IC failure analysis: the importance of test and diagnostics
- 期刊名称IEEE Design & Test of Computers
- 作者Vallett, D.P.
- 卷第14卷
- 期第3期
- 印刷ISSN0740-7475
- 文件大小1105.53KB
- 发表时间1997
- DOI10.1109/54.606001
- 页码76-82
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