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[IEEE Comput. Soc Sixth Asian Test Symposium (ATS'97) - Akita, Japan (17-19 Nov. 1997)] Proceedings Sixth Asian Test Symposium (ATS'97) - On chip weighted random patterns

[IEEE Comput. Soc Sixth Asian Test Symposium (ATS'97) - Akita, Japan (17-19 Nov. 1997)] Proceedings Sixth Asian Test Symposium (ATS'97) - On chip weighted random patterns

Savir, J.

作者Savir, J.
文件大小765.53KB
发表时间1997
DOI10.1109/ats.1997.643981
页码344-352

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