[IEEE Comput. Soc Sixth Asian Test Symposium (ATS'97) - Akita, Japan (17-19 Nov. 1997)] Proceedings Sixth Asian Test Symposium (ATS'97) - On decomposition of Kleene TDDs
Iguchi, Y.; Sasao, T.; Matsuura, M.
- 作者Iguchi, Y.; Sasao, T.; Matsuura, M.
- 文件大小546.83KB
- 发表时间1997
- DOI10.1109/ats.1997.643964
- 页码234-239