发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE Comput. Soc Sixth Asian Test Symposium (ATS'97) - Akita, Japan (17-19 Nov. 1997)] Proceedings Sixth Asian Test Symposium (ATS'97) - Low cost BIST for EDAC circuits

[IEEE Comput. Soc Sixth Asian Test Symposium (ATS'97) - Akita, Japan (17-19 Nov. 1997)] Proceedings Sixth Asian Test Symposium (ATS'97) - Low cost BIST for EDAC circuits

Badura, D.; Hlawiczka, A.

作者Badura, D.; Hlawiczka, A.
文件大小384.88KB
发表时间1997
DOI10.1109/ats.1997.643991
页码410-415

← 返回【学霸图书馆】主页