Segregation and trapping of erbium at a moving crystal-amorphous Si interface
- 期刊名称Journal of Applied Physics
- 作者Polman, A.; Custer, J. S.; Zagwijn, P. M.; Molenbroek, A. M.; Alkemade, P. F. A.
- 卷第81卷
- 期第1期
- 印刷ISSN0021-8979
- 文件大小339.68KB
- 发表时间1997
- DOI10.1063/1.364002
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