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[Int. Test Conference International Test Conference 1997 - Washington, DC, USA (1-6 Nov. 1997)] Proceedings International Test Conference 1997 - A unified interface for scan test generation based on STIL

[Int. Test Conference International Test Conference 1997 - Washington, DC, USA (1-6 Nov. 1997)] Proceedings International Test Conference 1997 - A unified interface for scan test generation based on STIL

Wohl, P.; Waicukauski, J.

作者Wohl, P.; Waicukauski, J.
文件大小723.07KB
发表时间1997
DOI10.1109/test.1997.639718
页码1011-1019

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