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A cross-sectional atomic force microscopy study of nanocrystalline Ge precipitates in SiO[sub 2] formed from metastable Si[sub 1−x]Ge[sub x]O[sub 2]

A cross-sectional atomic force microscopy study of nanocrystalline Ge precipitates in SiO[sub 2] formed from metastable Si[sub 1−x]Ge[sub x]O[sub 2]

Caragianis-Broadbridge, C.; Blaser, J. M.; Paine, D. C.

期刊名称Journal of Applied Physics
作者Caragianis-Broadbridge, C.; Blaser, J. M.; Paine, D. C.
卷第82卷
期第4期
印刷ISSN0021-8979
文件大小648.31KB
发表时间1997
DOI10.1063/1.365962

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