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[IEEE 1997 2nd International Workshop on Statistical Metrology - Kyoto, Japan (8 June 1997)] 1997 2nd International Workshop on Statistical Metrology - A systematic approach to statistical simulation of complex analog integrated circuits

[IEEE 1997 2nd International Workshop on Statistical Metrology - Kyoto, Japan (8 June 1997)] 1997 2nd International Workshop on Statistical Metrology - A systematic approach to statistical simulation of complex analog integrated circuits

Swidzinski, J.F.; Alexander, D.; Qu, M.; Styblinski, M.A.

作者Swidzinski, J.F.; Alexander, D.; Qu, M.; Styblinski, M.A.
文件大小285.96KB
发表时间1997
DOI10.1109/iwstm.1997.629420
页码86-89

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