SPIE Proceedings [SPIE Polarimetry and Ellipsometry - Kazimierz Dolny, Poland (Monday 20 May 1996)] Polarimetry and Ellipsometry - Application of polarimetry in optical computerized tomography of anisotropic media

Berezhna, S. Y.; Berezhnyi, I. V.; Krupych, O. M.; Vlokh, Orest G.; Pluta, Maksymilian; Wolinski, Tomasz R.

作者Berezhna, S. Y.; Berezhnyi, I. V.; Krupych, O. M.; Vlokh, Orest G.; Pluta, Maksymilian; Wolinski, Tomasz R.
卷第3094卷
印刷ISSN0277-786X
文件大小346.28KB
发表时间1997
DOI10.1117/12.271811
页码169-174

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