Defect population in silica glasses studied by luminescence VUV excitation spectroscopy
B. Poumellec; T. Taunay; P. Bernage; R. Cortes; J.C. Krupa
- 作者B. Poumellec; T. Taunay; P. Bernage; R. Cortes; J.C. Krupa
- 印刷ISSN0022-2313
- 文件大小254.50KB
- 发表时间1997
- DOI10.1016/s0022-2313(96)00042-7
- 页码442-445