Efficient type inclusion tests
- 期刊名称ACM SIGPLAN Notices
- 作者Vitek, Jan; Horspool, R. Nigel; Krall, Andreas
- 卷第32卷
- 期第10期
- 印刷ISSN0362-1340
- 文件大小2336.91KB
- 发表时间1997-10-09
- DOI10.1145/263700.263730
- 页码142-157
Statistical similarity of binariesDavid, Yaniv; Partush, Nimrod; Yahav, Eran · ACM SIGPLAN Notices · 2016
[ACM Press the 37th ACM SIGPLAN Conference - Santa Barbara, CA, USA (2016.06.13-2016.06.17)] Proceedings of the 37th ACM SIGPLAN Conference on Programming Language Design and Implementation - PLDI 2016 - Statistical similarity of binariesDavid, Yaniv; Partush, Nimrod; Yahav, Eran · 2016
[ACM Press the Twenty-Third International Conference - Williamsburg, VA, USA (2018.03.24-2018.03.28)] Proceedings of the Twenty-Third International Conference on Architectural Support for Programming Languages and Operating Systems - ASPLOS '18 - FirmUpDavid, Yaniv; Partush, Nimrod; Yahav, Eran · 2018
[ACM Press the 38th ACM SIGPLAN Conference - Barcelona, Spain (2017.06.18-2017.06.23)] Proceedings of the 38th ACM SIGPLAN Conference on Programming Language Design and Implementation - PLDI 2017 - Similarity of binaries through re-optimizationDavid, Yaniv; Partush, Nimrod; Yahav, Eran · 2017