Breakdown of gate oxides during irradiation with heavy ions
Johnston, A.H.; Swift, G.M.; Miyahira, T.; Edmonds, L.D.
- 期刊名称IEEE Transactions on Nuclear Science
- 作者Johnston, A.H.; Swift, G.M.; Miyahira, T.; Edmonds, L.D.
- 卷第45卷
- 期第6期
- 印刷ISSN0018-9499
- 文件大小1013.77KB
- 发表时间1998
- DOI10.1109/23.736491
- 页码2500-2508