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Signature analysis for analog and mixed-signal circuit test response compaction

Signature analysis for analog and mixed-signal circuit test response compaction

Nagi, N.; Chatterjee, A.; Heebyung Yoon; Abraham, J.A.

作者Nagi, N.; Chatterjee, A.; Heebyung Yoon; Abraham, J.A.
卷第17卷
期第6期
文件大小272.28KB
发表时间1998
DOI10.1109/43.703834
页码540-546

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