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[IEEE 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual - Reno, NV, USA (1998.03.31-1998.04.2)] 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual (Cat No 98CH36173) RELPHY-98 - Latchup in CMOS technology

[IEEE 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual - Reno, NV, USA (1998.03.31-1998.04.2)] 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual (Cat No 98CH36173) RELPHY-98 - Latchup in CMOS technology

Hargrove, M.J.; Voldman, S.; Gauthier, R.; Brown, J.; Duncan, K.; Craig, W.
  • 作者Hargrove, M.J.; Voldman, S.; Gauthier, R.; Brown, J.; Duncan, K.; Craig, W.
  • 文件大小956.17KB
  • 发表时间1998
  • DOI10.1109/RELPHY.1998.670561
  • 页码269-278
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