[IEEE 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual - Reno, NV, USA (1998.03.31-1998.04.2)] 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual (Cat No 98CH36173) RELPHY-98 - Latchup in CMOS technology
Hargrove, M.J.; Voldman, S.; Gauthier, R.; Brown, J.; Duncan, K.; Craig, W.
- 作者Hargrove, M.J.; Voldman, S.; Gauthier, R.; Brown, J.; Duncan, K.; Craig, W.
- 文件大小956.17KB
- 发表时间1998
- DOI10.1109/RELPHY.1998.670561
- 页码269-278