[IEEE International Symposium on Electromagnetic Compatibility (EMC'98) - Denver, CO, USA (24-28 Aug. 1998)] 1998 IEEE EMC Symposium. International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.98CH36253) - Scanning height for ANSI C63.5 calibrations
Cavcey, K.H.; Camell, D.G.
- 作者Cavcey, K.H.; Camell, D.G.
- 卷第2卷
- 文件大小251.22KB
- 发表时间1998
- DOI10.1109/ISEMC.1998.750333
- 页码935-938