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[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - New techniques for deterministic test pattern generation

[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - New techniques for deterministic test pattern generation

Hamzaoglu, I.; Patel, J. H.

作者Hamzaoglu, I.; Patel, J. H.
文件大小154.49KB
发表时间1998
DOI10.1109/VTEST.1998.670910
页码446-452

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