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[IEEE Comput. Soc Seventh Asian Test Symposium (ATS'98) - Singapore (2-4 Dec. 1998)] Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) - BIST TPG for combinational cluster (glue logic) interconnect testing at board level

[IEEE Comput. Soc Seventh Asian Test Symposium (ATS'98) - Singapore (2-4 Dec. 1998)] Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) - BIST TPG for combinational cluster (glue logic) interconnect testing at board level

Chen-Huan Chiang, ; Gupta, S.K.

作者Chen-Huan Chiang, ; Gupta, S.K.
文件大小1003.28KB
发表时间1998
DOI10.1109/ats.1998.741620
页码244-252

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