[IEEE Comput. Soc International Conference on Computer Design. VLSI in Computers and Processors - Austin, TX, USA (5-7 Oct. 1998)] Proceedings International Conference on Computer Design. VLSI in Computers and Processors (Cat. No.98CB36273) - An exact solution to the minimum size test pattern problem
Flores, P.F.; Neto, H.C.; Marques Silva, J.P.
- 作者Flores, P.F.; Neto, H.C.; Marques Silva, J.P.
- 文件大小35.83KB
- 发表时间1998
- DOI10.1109/iccd.1998.727097
- 页码510-515