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[IEEE ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings - Bangi, Malaysia (24-26 Nov. 1998)] ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.98EX187) - Degradation modeling of semiconductor devices and electrical circuits

[IEEE ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings - Bangi, Malaysia (24-26 Nov. 1998)] ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.98EX187) - Degradation modeling of semiconductor devices and electrical circuits

Lagies, A.U.; Gohler, L.; Sigg, J.; Turkes, P.; Kraus, R.
  • 作者Lagies, A.U.; Gohler, L.; Sigg, J.; Turkes, P.; Kraus, R.
  • 文件大小319.68KB
  • 发表时间1998
  • DOI10.1109/smelec.1998.781155
  • 页码86-90
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