[IEEE ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings - Bangi, Malaysia (24-26 Nov. 1998)] ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.98EX187) - Degradation modeling of semiconductor devices and electrical circuits
Lagies, A.U.; Gohler, L.; Sigg, J.; Turkes, P.; Kraus, R.
- 作者Lagies, A.U.; Gohler, L.; Sigg, J.; Turkes, P.; Kraus, R.
- 文件大小319.68KB
- 发表时间1998
- DOI10.1109/smelec.1998.781155
- 页码86-90