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[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Performance test case generation for microprocessors

[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Performance test case generation for microprocessors

Bose, P.

作者Bose, P.
文件大小29.61KB
发表时间1998
DOI10.1109/vtest.1998.670849
页码54-59

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