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[IEEE Comput. Soc Seventh Asian Test Symposium (ATS'98) - Singapore (2-4 Dec. 1998)] Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) - An automatic test pattern generator for at-speed robust path delay testing

[IEEE Comput. Soc Seventh Asian Test Symposium (ATS'98) - Singapore (2-4 Dec. 1998)] Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) - An automatic test pattern generator for at-speed robust path delay testing

Yuan-Chieh Hsu, ; Gupta, S.K.

作者Yuan-Chieh Hsu, ; Gupta, S.K.
文件大小806.78KB
发表时间1998
DOI10.1109/ats.1998.741595
页码88-95

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