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[IEEE 1998 Bipolar/BiCMOS Circuits and Technology Meeting - Minneapolis, MN, USA (27-29 Sept. 1998)] Proceedings of the 1998 Bipolar/BiCMOS Circuits and Technology Meeting (Cat. No.98CH36198) - Analysis of a Zener-triggered bipolar ESD structure in a BiCMOS technology
Coffing, D.; Ida, R.
- 作者Coffing, D.; Ida, R.
- 文件大小329.41KB
- 发表时间1998
- DOI10.1109/bipol.1998.741874
- 页码31-34
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