[IEEE 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual - Reno, NV, USA (1998.03.31-1998.04.2)] 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual (Cat No 98CH36173) RELPHY-98 - Effects of advanced processes on hot carrier reliability

• 作者Aur, S.; Grider, T.; McNeil, V.; Holloway, T.; Eklund, R.
• 文件大小318.12KB
• 发表时间1998
• DOI10.1109/relphy.1998.670512
• 页码180-183