[IEEE 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual - Reno, NV, USA (1998.03.31-1998.04.2)] 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual (Cat No 98CH36173) RELPHY-98 - Assessing circuit-level hot-carrier reliability

• 作者Jiang, W.; Le, H.; Chung, J.; Kopley, T.; Marcoux, P.; Dai, C.
• 文件大小610.38KB
• 发表时间1998
• DOI10.1109/relphy.1998.670509
• 页码173-179