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Tem Study of Defects in Laterally Overgrown GaN Layers

Tem Study of Defects in Laterally Overgrown GaN Layers

Liliental-Weber, Z.; Benamara, M.; Swider, W.; Washburn, J.; Park, J.; Grudowski, P. A.; Eiting, C. J.; Dupuis, R. D.
  • 期刊名称MRS Proceedings
  • 作者Liliental-Weber, Z.; Benamara, M.; Swider, W.; Washburn, J.; Park, J.; Grudowski, P. A.; Eiting, C. J.; Dupuis, R. D.
  • 卷第537卷
  • 电子ISSN1946-4274
  • 文件大小1939.93KB
  • 发表时间1998-1
  • DOI10.1557/proc-537-g4.6
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