Tem Study of Defects in Laterally Overgrown GaN Layers
Liliental-Weber, Z.; Benamara, M.; Swider, W.; Washburn, J.; Park, J.; Grudowski, P. A.; Eiting, C. J.; Dupuis, R. D.
- 期刊名称MRS Proceedings
- 作者Liliental-Weber, Z.; Benamara, M.; Swider, W.; Washburn, J.; Park, J.; Grudowski, P. A.; Eiting, C. J.; Dupuis, R. D.
- 卷第537卷
- 电子ISSN1946-4274
- 文件大小1939.93KB
- 发表时间1998-1
- DOI10.1557/proc-537-g4.6