Point defects in active layers of TFEL devices based on ZnS

• 作者Zhidong Lou; A. N. Georgobiani; Zheng Xu; Chunxiang Xu; Feng Teng; Lei Yu; Xurong Xu
• 卷第43卷
• 期第6期
• 印刷ISSN1001-6538
• 电子ISSN1861-9541
• 文件大小429.88KB
• 发表时间1998-03
• DOI10.1007/bf02883825
• 页码518-522