Crack initiation and growth characteristics in SiC/SiC under indentation test
W. Zhang; T. Hinoki; Y. Katoh; A. Kohyama; T. Noda; T. Muroga; J. Yu
- 作者W. Zhang; T. Hinoki; Y. Katoh; A. Kohyama; T. Noda; T. Muroga; J. Yu
- 印刷ISSN0022-3115
- 文件大小289.12KB
- 发表时间1998
- DOI10.1016/s0022-3115(98)00222-0
- 页码1577-1581