SiO2 passivation film effects on YBCO junctions
- 作者Seiichi Tokunaga; Yusuke Ohkawa; Katsumi Suzuki; Youichi Enomoto
- 卷第306卷
- 印刷ISSN0921-4534
- 文件大小233.61KB
- 发表时间1998
- DOI10.1016/s0921-4534(98)00356-6
- 页码107-113
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