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Integrated design of run-to-run PID controller and SPC monitoring for process disturbance rejection

Integrated design of run-to-run PID controller and SPC monitoring for process disturbance rejection

FUGEE Tsung; JIANJUN Shi
  • 作者FUGEE Tsung; JIANJUN Shi
  • 卷第31卷
  • 期第6期
  • 印刷ISSN0740-817X
  • 电子ISSN1545-8830
  • 文件大小186.95KB
  • 发表时间1999-05-20
  • DOI10.1023/a:1007698222427
  • 页码517-527
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