Electric field and temperature dependence of the stress induced leakage current: Fowler–Nordheim or Schottky emission?

• 作者P. Riess; G. Ghibaudo; G. Pananakakis; J. Brini; G. Ghidini
• 卷第245卷
• 印刷ISSN0022-3093
• 文件大小181.50KB
• 发表时间1999
• DOI10.1016/s0022-3093(98)00853-9