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[IEEE 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual - San Diego, CA, USA (23-25 March 1999)] 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) - Fault model for VLSI circuits reliability assessment

[IEEE 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual - San Diego, CA, USA (23-25 March 1999)] 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) - Fault model for VLSI circuits reliability assessment

Lisenker, B.; Mitnick, Y.

作者Lisenker, B.; Mitnick, Y.
文件大小645.15KB
发表时间1999
DOI10.1109/relphy.1999.761633
页码319-326

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