SPIE Proceedings [SPIE Optical Systems Design and Production - Berlin, Germany (Wednesday 26 May 1999)] Design and Engineering of Optical Systems II - Equivalent focal length measurements
- 作者Artzner, Guy E.; Auchere, Frederic; Delaboudiniere, Jean-Pierre; Hochedez, Jean-Francois E.; Merkle, Fritz
- 卷第3737卷
- 印刷ISSN0277-786X
- 文件大小237.98KB
- 发表时间1999
- DOI10.1117/12.360014
- 页码32-36