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[IEEE 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual - San Diego, CA, USA (23-25 March 1999)] 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) - A unified gate oxide reliability model

[IEEE 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual - San Diego, CA, USA (23-25 March 1999)] 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) - A unified gate oxide reliability model

Chenming Hu, ; Qiang Lu,

作者Chenming Hu, ; Qiang Lu,
文件大小369.13KB
发表时间1999
DOI10.1109/RELPHY.1999.761591
页码47-51

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