[IEEE 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual - San Diego, CA, USA (23-25 March 1999)] 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) - Threshold voltage shift caused by copper contamination
- 作者Vermeire, B.; Peterson, C.A.; Parks, H.G.; Sarid, D.
- 文件大小399.55KB
- 发表时间1999
- DOI10.1109/relphy.1999.761632
- 页码315-318
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