[IEEE 2000 22nd International Conference on Microelectronics. Proceedings - Nis, Yugoslavia (14-17 May 2000)] 2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) - Experimental determination of the intrinsic series resistance of vertical power diodes by means of a special test structure
- 作者Bellone, S.; Daliento, S.; Sanseverino, A.
- 卷第2卷
- 文件大小212.55KB
- 发表时间1999
- DOI10.1109/icmel.2000.838769
- 页码629-631