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[IEEE 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual - San Diego, CA, USA (23-25 March 1999)] 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) - Occurrence and elimination of anomalous temperature dependence of latchup trigger currents in BiCMOS processes

[IEEE 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual - San Diego, CA, USA (23-25 March 1999)] 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) - Occurrence and elimination of anomalous temperature dependence of latchup trigger currents in BiCMOS processes

Ooms, E.R.; Van der Pol, J.A.

作者Ooms, E.R.; Van der Pol, J.A.
文件大小609.73KB
发表时间1999
DOI10.1109/relphy.1999.761605
页码138-143

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