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[IEEE 2009 IEEE International Behavioral Modeling and Simulation Conference (BMAS 2009) - San Jose, CA, USA (2009.09.17-2009.09.18)] 2009 IEEE Behavioral Modeling and Simulation Workshop - Behavioral modeling of solute tracking in microfluidicsZeng, Y.; Azizi, F.; Mastrangelo, C. H. · 2009
[IEEE 2009 IEEE International Behavioral Modeling and Simulation Conference (BMAS 2009) - San Jose, CA, USA (2009.09.17-2009.09.18)] 2009 IEEE Behavioral Modeling and Simulation Workshop - Title pages2009
[IEEE 2009 IEEE International Behavioral Modeling and Simulation Workshop. BMAS 2009 - San Jose, CA (2009.9.17-2009.9.18)] 2009 IEEE Behavioral Modeling and Simulation Workshop - [Front and back covers]2009
[IEEE 2009 IEEE International Behavioral Modeling and Simulation Conference (BMAS 2009) - San Jose, CA, USA (2009.09.17-2009.09.18)] 2009 IEEE Behavioral Modeling and Simulation Workshop - Virtual skin: a behavioral approach helps verificationNicholle, Benjamin; Legendre, Arnaud; Ferrero, Louis; Zastrow, Leonhard · 2009
[IEEE 2009 IEEE International Behavioral Modeling and Simulation Conference (BMAS 2009) - San Jose, CA, USA (2009.09.17-2009.09.18)] 2009 IEEE Behavioral Modeling and Simulation Workshop - Analog behavior refinement in system centric modelingZaidi, Yaseen; Grimm, Christoph; Haase, Jan · 2009
[IEEE 2009 IEEE International Behavioral Modeling and Simulation Conference (BMAS 2009) - San Jose, CA, USA (2009.09.17-2009.09.18)] 2009 IEEE Behavioral Modeling and Simulation Workshop - AMS static voltage level checkSilva, Marcelo · 2009
[IEEE 2009 IEEE International Behavioral Modeling and Simulation Conference (BMAS 2009) - San Jose, CA, USA (2009.09.17-2009.09.18)] 2009 IEEE Behavioral Modeling and Simulation Workshop - A modeling methodology for verifying functionality of a wireless chipChen, Jesse E. · 2009
[IEEE 2009 IEEE International Behavioral Modeling and Simulation Conference (BMAS 2009) - San Jose, CA, USA (2009.09.17-2009.09.18)] 2009 IEEE Behavioral Modeling and Simulation Workshop - Supporting dimensional analysis in SystemC-AMSMaehne, Torsten; Vachoux, Alain · 2009
Generation of Random Parameters of Behavioral ModelsLange, André; Haase, Joachim; Sohrmann, Christoph; Jancke, Roland · IFAC Proceedings Volumes · 2012
Multivariate Modeling of Variability Supporting Non-Gaussian and Correlated ParametersLange, Andre; Sohrmann, Christoph; Jancke, Roland; Haase, Joachim; Cheng, Binjie; Asenov, Asen; Schlichtmann, Ulf · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2016
[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Probabilistic standard cell modeling considering non-Gaussian parameters and correlationsLange, Andre; Sohrmann, Christoph; Jancke, Roland; Haase, Joachim; Lorenz, Ingolf; Schlichtmann, Ulf · 2014
[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Probabilistic standard cell modeling considering non-Gaussian parameters and correlationsLange, Andre; Sohrmann, Christoph; Jancke, Roland; Haase, Joachim; Lorenz, Ingolf; Schlichtmann, Ulf · 2014
[IEEE ESSDERC 2011 - 41st European Solid State Device Research Conference - Helsinki, Finland (2011.09.12-2011.09.16)] 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - A general approach for multivariate statistical MOSFET compact modeling preserving correlationsLange, Andre; Sohrmann, Christoph; Jancke, Roland; Haase, Joachim; Cheng, Binjie; Kovac, Urban; Asenov, Asen · 2011