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[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - A comprehensive MOSFET mismatch model

[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - A comprehensive MOSFET mismatch model

Drennan, P.G.; McAndrew, C.C.

作者Drennan, P.G.; McAndrew, C.C.
文件大小314.66KB
发表时间1999
DOI10.1109/iedm.1999.823871
页码167-170

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