[Int. Test. Conference IEEE Computer Society International Test Conference (ICSM'99) - Atlantic City, NJ, USA (28-30 Sept. 1999)] International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) - Breaking the complexity spiral in board test
- 作者Scheiber, S.F.
- 文件大小553.64KB
- 发表时间1999
- DOI10.1109/test.1999.805625
- 页码155-158
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